Features

• 190 to 1150 nm, Silicon detector
• 650 to 1800 nm, InGaAs detector
• 1000 to 2300 or 2500 nm, InGaAs (extended) detector
• Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
• 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
• 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
• Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
• Port-powered USB 2.0; flexible 3 m cable; no power brick
• 0.1 µm sampling and resolution
• Linear & log X-Y profiles, centroid
• Profile zoom & slit width compensation
• Real-time multiple Z plane scanning slit system
• Real-time XYZ profiles, Focus position
• Real-time M², Divergence, Collimation, Alignment